The purpose of this workshop is to bring researchers and practitioners of LSI testing from all over the world together to exchange ideas and experiences in register transfer level (RTL), high level and system level testing. WRTLT’16, the seventeenth workshop, will be held in conjunction with the 25th Asian Test Symposium (ATS’16) in Hiroshima, Japan. We hope and expect this workshop provides an ideal forum for frank discussion on this important topic for the future system-on-a-chip (SoC) devices.