Original papers are solicited presenting new developments in topics relevant to ICMTS, including but not limited to, test structures measurements and results, about:

• R&D and Manufacture of IC, M(N)EMS, Sensors, Actuators, Bio, solar, displays, and emergent technologies.

• Material – Process – New technologies Characterizations.

• New devices – Memory Cells – Arrays.

• DC – Pulsed – RF: measurements techniques and applications.

• Design methods – Verification – Metrology.

• Devices and Circuits Modeling – Parameter Extraction.

• Matching – Variability.

• Reliability – Wafer level / thermal Product Failure Analysis & prediction.

• Yield Enhancement – Production Process Control.

• Measurements – Statistical – Probing – Throughput - Analysis – Strategies.