The main theme of this conference is microwave measurements. Technical papers are solicited describing original work in the areas of measurement requirements for new, emerging, and developing technologies including, but not limited to, medical/biological areas, nanomaterials, graphene and related materials, and THz and related high frequency areas. Topics of particular interest include: Materials measurements for emerging technologies, Measurements in extreme impedance environments, mm-wave/THz and other higher frequency measurement measurements in highly nonlinear environments, de-embedding and correction methods for complex interfaces/fixtures, and all areas of RF, microwave and/or millimeter wave measurement.