活动简介

VLSI Design and test VDAT is a flagship event of the VLSI Society of India. This Symposium follows successful organization of nineteen symposiums in previous years. VDAT -2016 is being organized at Indian Institute of Technology Guwahati, India. In true sense, VDAT-2016 is a focused research event encompassing themes related to various disciplines of VLSI. The objective of the symposium is to bring professional engineers, academicians and research scholars of matching interests on a common platform to share new ideas, experiences, and knowledge in various fields of VLSI Design, Test and Technology. The scientific program will consist of peer-reveiwed paper presentations in parallel technical sessions. In addition, keynote lectures, presentation by industry professionals, panel discussions, tutorials and poster presentation will be conducted during the conference. Such interactions will faciliate better understanding about technological developments all across the globe amongst the peers. This conference will certainly ignite the minds of the researchers for undertaking more interdisciplinary collaborative research for up gradation of technology.

征稿信息

征稿范围

Researchers, academicians and professionals are invited to submit paper in the topic of interest (but not limited to):

  • VLSI Design and Semiconductor Device Modelling: Analog and RF mixed signal design; Design and modeling of digital circuits and systems; FPGA prototyping of algorithms; Synthesis; Optoelectronic devices and circuits; MEMS, Deep Submicron and Nanometer devices and circuits; Power analysis and low-power design; Thermal analysis and temperature aware design; Physical design, packaging and board design; CAD for design and technology; High performance computing; System-on-chip designs; Networks-on-chip Design .
  • Emerging Technology: Nanoscale computing and nanotechnology; Reversible computation; Nano-Electro-Mechanical Systems (NEMS); CAD research in the areas of emerging technology and emerging systems.
  • Testing and Verification: Design for testability; Test generation and fault simulation; Built-in self- test; Verification (simulation and formal); Design for manufacturability and yield analysis; Testing memories and regular logic arrays.
  • Embedded Systems: Hardware/software co-design and verification; Audio, Image and Video processing; Reconfigurable systems; Applications in communications, Encryption, Security, Compression, etc.; Embedded software tools; FPGA prototyping of complete systems; CAD for embedded systems.
留言
验证码 看不清楚,更换一张
全部留言
重要日期
  • 会议日期

    05月24日

    2016

    05月27日

    2016

  • 05月27日 2016

    注册截止日期

移动端
在手机上打开
小程序
打开微信小程序
客服
扫码或点此咨询