International Test Conference, the cornerstone of TestWeek events, is the premier comference dedicated to the electronic test of devices, boards, and systems - covering the complete cycle from design verification, test, diagnosis, failure analysis, and back to process improvement. AtITC, test and verification professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tools and equipment designers, and test engineers.
10月10日
2026
10月17日
2026
初稿截稿日期
注册截止日期
2025年09月20日 美国 San Diego
2025 IEEE International Test Conference
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