The future of instrument development necessitates sending out only indispensable information rather than raw data. The new framework of compressive sampling, together with automated data mining, presents new challenges and opportunities for instrument innovations. This interdisciplinary workshop, open to all IEEE NSS/MIC participants, offers a platform for sharing needs, ideas, and experiences to integrate data analytics and machine-learning algorithms with hardware, with the ultimate goal of developing information-driven, or intelligent, instruments for NSS/MIC and related fields.