115 / 2024-04-13 13:08:07
Simulation Study of Temperature Distribution Characteristics of 252 kV Single-break Vacuum Interrupters
vacuum interrupter,electromagnetic-temperature field simulation excitation,temperature rise characteristics
全文录用
Ziqi Shao / Chongqing University
Jian Hao / Chongqing University
Xu Li / Chongqing University
Ying Li / Chongqing University
Qingsong Liu / Chongqing University
Yi Lin / Chongqing University
Simulation Study of Temperature Distribution Characteristics of 252 kV Single-break Vacuum Interrupters

Ziqi Shao, Jian Hao*, Xu Li, Ying Li, Qingsong Liu, Yi Lin

State Key Laboratory of Power Transmission Equipment Technology, School of Electrical Engineering, Chongqing University, Chongqing, 400044, China


Temperature rise characteristics is an important characteristic that affects the working state of the vacuum interrupter, understanding and mastering its temperature distribution and temperature rise law and its hot spot temperature monitoring research, to avoid the interrupter due to thermal faults caused by the performance of the destruction of the practical significance of the engineering has an significant engineering. This paper carries out a simulation study on the temperature distribution characteristics of 252 kV single-break vacuum interrupter, and obtains the internal and external temperature distribution characteristics of the interrupter under the rated current flow. The results show that the arc extinguishing chamber shell temperature decreases from both ends to the middle, and the static end of the shell temperature is slightly higher than the moving end of the shell temperature; rated current under the arc extinguishing chamber, the highest temperature occurs in the dynamic and static contacts between the contact plate contact place, about 77.8 ℃, contact plate temperature decreases from the center to the edge. In this paper, the simulation of the temperature distribution characteristics of the interrupter chamber can provide guidance to overcome the large size and complex structure of the vacuum interrupter contact temperature perception problems.


 



 
重要日期
  • 会议日期

    11月10日

    2024

    11月13日

    2024

  • 11月11日 2024

    初稿截稿日期

  • 11月19日 2024

    注册截止日期

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