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Testability design of spacecraft test equipment based on BIT
编号：51 访问权限：公开 更新：2022-12-20 21:17:24 浏览：548次 张贴报告

报告开始：暂无开始时间（Asia/Shanghai）

报告时间：暂无持续时间

所在会场：[暂无会议] [暂无会议段]

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摘要
In this paper, the requirements of power supply and distribution, measurement and control, control and propulsion and other front-end special equipment in the integrated test system of deep space spacecrafts are analyzed, and the testability design method of built-in-test (BIT) of the equipment is studied. It mainly includes the testability design of the key circuit of the board and the device port signal between board and device. Carry out various design of BIT models of analog input / output and digital input / output signals to realize non-destructive or low-loss real-time monitoring of signals. This paper designs a verification environment for BIT function application, and verifies the correctness of BIT design for standard mode and failure mode. It provides a technical method for real-time health diagnosis and failure warning of space equipment in unattended condition.The technology achievement  has been applied in the ground integrated test system of Chang'e-6 probe.
 
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报告人
Zhao Yang
Beijing Institute of Spacecraft System Engineering

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重要日期

  • 会议日期

    11月30日

    2022

    至

    12月02日

    2022

  • 11月30日 2022

    初稿截稿日期

  • 12月24日 2022

    报告提交截止日期

  • 04月13日 2023

    注册截止日期

主办单位
Harbin Insititute of Technology
China Instrument and Control Society
Heilongjiang Instrument and Control Society
Chinese Institute of Electronics
IEEE I&M Society Harbin Chapter
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