An integrated circuit test method based on a hidden Markov model for controlling temperature is proposed. The power consumption and temperature issues of integrated circuit during testing are calcu-lated according to test characteristics and circuit structure on the basis of not affecting the fault coverage. Meanwhile, for further discussion to reduce the test time, a test sequence method with the least test time at a specified temperature is proposed. The experimental results indicate that after test vector sorting, the time can be effectively reduced, and the temperature of the circuit under test can be controlled to avoid damage to the chip caused by excessive temperature. Thereby the quality of the chip is improved and the test cost is reduced.

adaptive test; power consumption testing; temperature testing; test vector sorting; hidden Markov model